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Proceedings Paper

Design and image quality results from volumetric CT with a flat-panel imager
Author(s): William Ross; Samit Basu; Peter M. Edic; Mark Johnson; Armin H. Pfoh; Ramakrishna Rao; Baorui Ren
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Paper Abstract

Preliminary MTF and LCD results obtained on several volumetric computed tomography (VCT) systems, employing amorphous flat panel technology, are presented. Constructed around 20-cm x 20-cm, 200-mm pitch amorphous silicon x-ray detectors, the prototypes use standard vascular or CT x-ray sources. Data were obtained from closed-gantry, benchtop and C-arm-based topologies, over a full 360 degrees of rotation about the target object. The field of view of the devices is approximately 15 cm, with a magnification of 1.25-1.5, providing isotropic resolution at isocenter of 133-160 mm. Acquisitions have been reconstructed using the FDK algorithm, modified by motion corrections also developed by GE. Image quality data were obtained using both industry standard and custom resolution phantoms as targets. Scanner output is compared on a projection and reconstruction basis against analogous output from a dedicated simulation package, also developed at GE. Measured MTF performance is indicative of a significant advance in isotropic image resolution over commercially available systems. LCD results have been obtained, using industry standard phantoms, spanning a contrast range of 0.3-1%. Both MTF and LCD measurements agree with simulated data.

Paper Details

Date Published: 28 June 2001
PDF: 9 pages
Proc. SPIE 4320, Medical Imaging 2001: Physics of Medical Imaging, (28 June 2001); doi: 10.1117/12.430906
Show Author Affiliations
William Ross, GE Corporate Research and Development Ctr. (United States)
Samit Basu, GE Corporate Research and Development Ctr. (United States)
Peter M. Edic, GE Corporate Research and Development Ctr. (United States)
Mark Johnson, GE Corporate Research and Development Ctr. (United States)
Armin H. Pfoh, GE Corporate Research and Development Ctr. (United States)
Ramakrishna Rao, GE John F. Welch Technology Ctr. (India)
Baorui Ren, Nortel Networks (United States)


Published in SPIE Proceedings Vol. 4320:
Medical Imaging 2001: Physics of Medical Imaging
Larry E. Antonuk; Martin Joel Yaffe, Editor(s)

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