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Proceedings Paper

Adaptive view synthesis for aliasing artifact reduction
Author(s): Jiang Hsieh; Christopher L. Slack; Sandeep Dutta; Clarence L. Gordon; Jay Li; Edward Chao
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Paper Abstract

In recent years, the scan speed of computed tomography (CT) has increased significantly. Not long ago, the state-of-the- art CT was only capable of completing a single scan in 1.0 s per gantry rotation. Nowadays, 0.5 s per revolution is nearly an industry standard. Faster scan speeds demand faster sampling of the projections to combat aliasing artifacts, and higher x-ray tube output to ensure sufficient x-ray photon flux delivered to the scan. These demands often exceed the technological capability of these components. In this paper we performed a detailed analysis on the characteristics of the view aliasing artifact. Based on our analysis and clinical observations, we propose an adaptive view synthesis (AVS) scheme that effectively reduces the demands on the data acquisition system. Detailed performance comparison between the full view sampling and the adaptive view synthesis are performed through computer simulations and phantom experiments. Our analysis indicates that AVS is adequate for routine clinical applications.

Paper Details

Date Published: 28 June 2001
PDF: 8 pages
Proc. SPIE 4320, Medical Imaging 2001: Physics of Medical Imaging, (28 June 2001); doi: 10.1117/12.430899
Show Author Affiliations
Jiang Hsieh, GE Medical Systems (United States)
Christopher L. Slack, GE Medical Systems (United States)
Sandeep Dutta, GE Medical Systems (United States)
Clarence L. Gordon, GE Medical Systems (United States)
Jay Li, GE Medical Systems (United States)
Edward Chao, GE Medical Systems (United States)


Published in SPIE Proceedings Vol. 4320:
Medical Imaging 2001: Physics of Medical Imaging
Larry E. Antonuk; Martin Joel Yaffe, Editor(s)

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