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Proceedings Paper

Development and characterization of a dual-energy subtraction imaging system for chest radiography based on CsI:Tl amorphous silicon flat-panel technology
Author(s): John M. Sabol; Gopal B. Avinash; Francois Nicolas; Bernhard E. H. Claus; Jianguo Zhao; James T. Dobbins III
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Paper Abstract

Dual-energy subtraction imaging increases the sensitivity and specificity of pulmonary nodule detection in chest radiography by reducing the contrast of overlying bone structures. Recent development of a fast, high-efficiency detector enables dual-energy imaging to be integrated into the traditional workflow. We have modified a GE RevolutionTM XQ/i chest imaging system to construct a dual-energy imaging prototype system. Here we describe the operating characteristics of this prototype and evaluate image quality. Empirical results show that the dual-energy CNR is maximized if the dose is approximately equal for both high and low energy exposures. Given the high detector DQE, and allocation of dose between the two views, we can acquire dual-energy PA and conventional lateral images with total dose equivalent to a conventional two-view film chest exam. Calculations have shown that the dual-exposure technique has superior CNR and tissue cancellation than single-exposure CR systems. Clinical images obtained on a prototype dual-energy imaging system show excellent tissue contrast cancellation, low noise, and modest motion artefacts. In summary, a prototype dual-energy system has been constructed which enables rapid, dual-exposure imaging of the chest using a commercially available high-efficiency, flat-panel x-ray detector. The quality of the clinical images generated with this prototype exceeds that of CR techniques and demonstrates the potential for improved detection and characterization of lung disease through dual-energy imaging.

Paper Details

Date Published: 28 June 2001
PDF: 10 pages
Proc. SPIE 4320, Medical Imaging 2001: Physics of Medical Imaging, (28 June 2001); doi: 10.1117/12.430897
Show Author Affiliations
John M. Sabol, GE Medical Systems (United States)
Gopal B. Avinash, GE Medical Systems (United States)
Francois Nicolas, GE Medical Systems (United States)
Bernhard E. H. Claus, GE Corporate Research and Development Ctr. (United States)
Jianguo Zhao, GE Corporate Research and Development Ctr. (United States)
James T. Dobbins III, Duke Univ. Medical Ctr. (United States)


Published in SPIE Proceedings Vol. 4320:
Medical Imaging 2001: Physics of Medical Imaging
Larry E. Antonuk; Martin Joel Yaffe, Editor(s)

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