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Proceedings Paper

Fast imaging of a 41-cm amorphous silicon flat-panel detector for radiographic applications
Author(s): Kenneth S. Kump
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Paper Abstract

A production 41cm square digital flat panel detector constructed of amorphous silicon with a cesium iodide scintillator was characterized for its applicability to 'fast' radiographic imaging. Representative fast imaging clinical applications include tomosynthesis and dual energy utilizing two exposures. The detector supports a read time of 125msec at a radiographic dynamic range of 7mR, giving a frame rate of 7.5 acquisitions per second. Detector performance measures of lag, detector sensitivity, and DQE were evaluated as a function of acquisition rate and exposure. The first frame lag is approximately 2% of the stimulus and decays to less than 0.5% for all subsequent frames. In a sequence at constant exposure, the lag builds up as the signal level grows to 5%, reaching a steady state after approximately 15 frames. The DQE measurement is affected by lag and must be corrected. The GE radiographic detector has outstanding dynamic performance and gives all indications that it will meet the fast imaging application requirements.

Paper Details

Date Published: 28 June 2001
PDF: 7 pages
Proc. SPIE 4320, Medical Imaging 2001: Physics of Medical Imaging, (28 June 2001); doi: 10.1117/12.430888
Show Author Affiliations
Kenneth S. Kump, GE Medical Systems (United States)


Published in SPIE Proceedings Vol. 4320:
Medical Imaging 2001: Physics of Medical Imaging
Larry E. Antonuk; Martin Joel Yaffe, Editor(s)

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