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Proceedings Paper

Critical role of near-field optics in DWDM tests and measurements
Author(s): Aaron Lewis
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Proc. SPIE 4640, Integrated Optics: Devices, Materials, and Technologies VI, ; doi: 10.1117/12.430153
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Published in SPIE Proceedings Vol. 4640:
Integrated Optics: Devices, Materials, and Technologies VI
Yakov S. Sidorin; Ari Tervonen, Editor(s)

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