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Proceedings Paper

Refractometric sensing based on controlling attenuation in optical waveguides
Author(s): Sergey M. Dovgalets; Anatoly S. Vasyra; Valery V. Skaldutsky
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Paper Abstract

The study of a refractometric sensor based on controlling attenuation in the optical waveguide consisting of a multimode lossless rod and thin dielectric lossy films of higher refractive index as compared to the rod has been carried out. It has been shown that provision of the rod principle modes cutoff regime causes an increase of the sensor output power while the surrounding medium measuring refractive index increases. The sensor sensitivity strongly depend on the films material attenuation constant in this case.

Paper Details

Date Published: 12 June 2001
PDF: 5 pages
Proc. SPIE 4425, Selected Papers from the International Conference on Optoelectronic Information Technologies, (12 June 2001); doi: 10.1117/12.429774
Show Author Affiliations
Sergey M. Dovgalets, Vinnytsia State Technical Univ. (Ukraine)
Anatoly S. Vasyra, Vinnytsia State Technical Univ. (Ukraine)
Valery V. Skaldutsky, Vinnytsia State Technical Univ. (Ukraine)


Published in SPIE Proceedings Vol. 4425:
Selected Papers from the International Conference on Optoelectronic Information Technologies
Sergey V. Svechnikov; Volodymyr P. Kojemiako; Sergey A. Kostyukevych, Editor(s)

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