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Proceedings Paper

Influence of transition film-substrate layers on optical properties of the multilayer structures
Author(s): Yury A. Pervak; A. Mitsa; I. Holovach; Ishtvan V. Fekeshgazi
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Paper Abstract

The influence of thickness (dt) and refractive index of the transition film-substrate region at different regularities of the change in nt from the interface nt equals 2.6 to the central part of the film nf equals 2.05 on spectral characteristics of quarter-wavelength films with an operating length (lambda) 0 equals 400 nm has been considered. The regularities of the change in the extremum (Tmin) and frequency position of (lambda) o depending on the thickness dt varying from 0 to 300 nm with the increment of 30 nm have been modeled. A stepwise character of the distribution nt has been found to have the largest influence on the change in Tmin and (lambda) 0. The results of the influence of thickness and character of the change in nt in a high-refractive layer of 11-layer rejection filter S - BH...HB on the position of Tmin and (lambda) o are given.

Paper Details

Date Published: 12 June 2001
PDF: 5 pages
Proc. SPIE 4425, Selected Papers from the International Conference on Optoelectronic Information Technologies, (12 June 2001); doi: 10.1117/12.429744
Show Author Affiliations
Yury A. Pervak, Institute of Semiconductor Physics (Ukraine)
A. Mitsa, Uzhgorod State Univ. (Ukraine)
I. Holovach, Uzhgorod State Univ. (Ukraine)
Ishtvan V. Fekeshgazi, Institute of Semiconductor Physics (Ukraine)


Published in SPIE Proceedings Vol. 4425:
Selected Papers from the International Conference on Optoelectronic Information Technologies
Sergey V. Svechnikov; Volodymyr P. Kojemiako; Sergey A. Kostyukevych, Editor(s)

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