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Proceedings Paper

Algorithms for pattern recognition in images of cell cultures
Author(s): Joyce Martins Mendes; Nathalia L.V. Peixoto; Francisco Javier Ramirez-Fernandez
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Paper Abstract

Several applications of silicon microstructures in areas such as neurobiology and electrophysiology have been stimulating the development of microsystems with the objective of mechanical support to monitor and control several parameters in cell cultures. In this work a multi-microelectrode arrays was fabricated over a glass plate to obtain the growth of neuronal cell monitoring their behavior during cell development. To identify the neuron core and axon an approach for implementation of edge detectors algorithms associated to images is described. The necessity of efficient and reliable algorithms for image processing and interpretation is justified by its large field of applications in several areas as well as medicine, robotics, cellular biology, computational vision and pattern recognition. In this work, it is investigated the adequacy of some edge detectors algorithms such as Canny, Marr-Hildreth. Some alterations in those methods are propose to improve the identification of both cell core and axonal growth measure. We compare the operator to edge detector proposed by Canny, Marr-Hildreth operator and application of Hough Transform. For evaluation of algorithms adaptations, we developed a method for automatic cell segmentation and measurement. Our goal is to find a set of parameters defining the location of the objects to compare the original and processed images.

Paper Details

Date Published: 12 June 2001
PDF: 9 pages
Proc. SPIE 4425, Selected Papers from the International Conference on Optoelectronic Information Technologies, (12 June 2001); doi: 10.1117/12.429737
Show Author Affiliations
Joyce Martins Mendes, Univ. de Sao Paulo (Brazil)
Nathalia L.V. Peixoto, Univ. de Sao Paulo (Brazil)
Francisco Javier Ramirez-Fernandez, Univ. de Sao Paulo (Brazil)


Published in SPIE Proceedings Vol. 4425:
Selected Papers from the International Conference on Optoelectronic Information Technologies

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