Share Email Print
cover

Proceedings Paper

Polarimetric sensors for damage detection of aluminum materials
Author(s): Wee Meng Chang; Poh Kok Ng; Su-fern Shirin Sng; Jianjun Ma; Anand Krishna Asundi; Jayanth Puttappa
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A PFOS for monitoring and detecting damages in aluminum specimen has been demonstrated. It has been shown that PFOS can be used to monitor the development of cracks and predict residual load on aluminum structures. The experimental result obtained is very consistent and the sensor is immune to temperature changes and electromagnetic interference, as it does not require a reference are more accurate for damage detection. Some of the features such as low cost, durable, light weight and real-time applications of PFOS have been highlighted.

Paper Details

Date Published: 13 June 2001
PDF: 6 pages
Proc. SPIE 4317, Second International Conference on Experimental Mechanics, (13 June 2001); doi: 10.1117/12.429577
Show Author Affiliations
Wee Meng Chang, Ngee Ann Polytechnic (Singapore)
Poh Kok Ng, Ngee Ann Polytechnic (Singapore)
Su-fern Shirin Sng, Ngee Ann Polytechnic (Singapore)
Jianjun Ma, Nanyang Technological Univ. (Singapore)
Anand Krishna Asundi, Nanyang Technological Univ. (Singapore)
Jayanth Puttappa, Ngee Ann Polytechnic (Singapore)


Published in SPIE Proceedings Vol. 4317:
Second International Conference on Experimental Mechanics
Fook Siong Chau; Chenggen Quan, Editor(s)

© SPIE. Terms of Use
Back to Top