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Proceedings Paper

Elliptically polarized white-light photoviscoelastic technique and its application
Author(s): Satoru Yoneyama; Masahisa Takashi
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Paper Abstract

The present paper demonstrates the successful application of the photo viscoelastic technique using elliptically polarized white light to the stress field evaluation of the crack growth in a viscoelastic strip. Using the proposed technique, which can determine both iso chromatic and iso clinic parameters simultaneously from a single color image, the time-dependent stress intensity factor extended for linearly viscoelastic materials is evaluated from the experimental results using a method based on least-squares. The result show that the value of the prosed critical stress intensity factor for fast crack growth may be considered as a characteristic property of the material under monotonically increasing load.

Paper Details

Date Published: 13 June 2001
PDF: 6 pages
Proc. SPIE 4317, Second International Conference on Experimental Mechanics, (13 June 2001); doi: 10.1117/12.429562
Show Author Affiliations
Satoru Yoneyama, Wakayama Univ. (Japan)
Masahisa Takashi, Aoyama Gakuin Univ. (Japan)


Published in SPIE Proceedings Vol. 4317:
Second International Conference on Experimental Mechanics
Fook Siong Chau; Chenggen Quan, Editor(s)

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