Share Email Print
cover

Proceedings Paper

Dependence of optical properties of porous silicon on its porosity
Author(s): M. I. Strashnikova; Vladimir L. Voznyi; Vladimir Ya. Gayvoronsky; V. Reznichenko; R. Hristosenko
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Absorption and refractive index dispersion spectra of porous silicon (por-Si) samples with different porosity were measured for energy interval 1.5-3.5 eV at room temperature. Experimental data were compared with dependencies calculated using Bruggemann formula for dielectric function of multicomponent medium consisted of crystalline silicon. SiO2, amorphous silicon and voids. The best agreement between experimental data and theory was obtained for the comparatively large concentration of SiO2 in the por-Si samples.

Paper Details

Date Published: 30 May 2001
PDF: 11 pages
Proc. SPIE 4418, Eighth International Conference on Nonlinear Optics of Liquid and Photorefractive Crystals, 44180Y (30 May 2001); doi: 10.1117/12.428320
Show Author Affiliations
M. I. Strashnikova, Institute of Physics (Ukraine)
Vladimir L. Voznyi, Institute of Physics (Ukraine)
Vladimir Ya. Gayvoronsky, Institute of Physics (Ukraine)
V. Reznichenko, Institute of Physics (Ukraine)
R. Hristosenko, Institute of Physics (Ukraine)


Published in SPIE Proceedings Vol. 4418:
Eighth International Conference on Nonlinear Optics of Liquid and Photorefractive Crystals
Gertruda V. Klimusheva; Andrey G. Iljin, Editor(s)

© SPIE. Terms of Use
Back to Top