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Proceedings Paper

Detailed atomic kinetics model for the spectroscopic analysis of laser-ablated plasma plumes
Author(s): Manolo E. Sherrill; Roberto C. Mancini; James E. Bailey; Alex B. Filuk; Brian F. Clark; Patrick Lake; Joseph Abdallah
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Paper Abstract

Atomic kinetics and spectral modeling have revealed that level populations of plasma atoms in laser-ablated plumes may behave in a time-dependent manner, i.e. far from Local Thermodynamic Equilibrium, and that cascading population mechanisms can lead to long-lived atomic line emission. The time-scales associated to this phenomena and the interpretation of spectral data critically depend on the details of the atomic kinetics model and the quality of the rate coefficients. In order to generate accurate atomic data for neural atoms and low-charge ions present in plasma plumes, a semi-empirical techniques has been implemented in the Los Alamos atomic structure and electron scattering codes. This procedure has allowed neutrals with complex atomic structure--such as those atoms from elements often used in industrial applications--to be calculated with spectroscopic quality. Details of the atomic kinetics model for the case of a Li-Ag plasma plume and the rates generated with this new procedure are presented and discussed.

Paper Details

Date Published: 29 May 2001
PDF: 8 pages
Proc. SPIE 4276, Commercial and Biomedical Applications of Ultrashort Pulse Lasers; Laser Plasma Generation and Diagnostics, (29 May 2001); doi: 10.1117/12.428007
Show Author Affiliations
Manolo E. Sherrill, Univ. of Nevada/Reno (United States)
Roberto C. Mancini, Univ. of Nevada/Reno (United States)
James E. Bailey, Sandia National Labs. (United States)
Alex B. Filuk, Sandia National Labs. (United States)
Brian F. Clark, Sandia National Labs. (United States)
Patrick Lake, Sandia National Labs. (United States)
Joseph Abdallah, Los Alamos National Lab. (United States)


Published in SPIE Proceedings Vol. 4276:
Commercial and Biomedical Applications of Ultrashort Pulse Lasers; Laser Plasma Generation and Diagnostics
Richard F. Haglund; Richard F. Haglund; Richard F. Wood; Joseph Neev; Richard F. Wood, Editor(s)

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