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Proceedings Paper

Generic and robust approach for the analysis of spot array images
Author(s): Norbert Braendle; Horst Bischof; Hilmar Lapp
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Paper Abstract

We present a generic and robust image analysis approach applicable to image data resulting from a broad class of hybridization experiments. The ultimate image analysis goal is to automatically assign a quantity to every array element (spot), giving information about the hybridization signal. Irrespective of the quantification strategy, the most important preliminary information to extract about a spot is the mapping between its location in the digital image and its position in the spot grid (grid fitting). We present a grid fitting approach divided into a spot amplification step (matched filter), a rotation estimation step (Radon transform) and a grid spanning step. Quantification of the hybridization signals is performed with different fitting approaches. The primary approach is a robust fitting of a parametric model with the help of M-estimators. The main advantage of parametric spot fitting is its ability to cope with overlapping spots. If the goodness-of-fit is too bad, a semi-parametric spot fitting is employed.

Paper Details

Date Published: 4 June 2001
PDF: 12 pages
Proc. SPIE 4266, Microarrays: Optical Technologies and Informatics, (4 June 2001); doi: 10.1117/12.427983
Show Author Affiliations
Norbert Braendle, Vienna Univ. of Technology (Austria)
Horst Bischof, Vienna Univ. of Technology (Austria)
Hilmar Lapp, Novartis Research Institute Vienna (United States)


Published in SPIE Proceedings Vol. 4266:
Microarrays: Optical Technologies and Informatics
Michael L. Bittner; Yidong Chen; Andreas N. Dorsel; Edward R. Dougherty, Editor(s)

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