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Proceedings Paper

Interferometric phase-based dual-wavelength tomography
Author(s): Changhuei Yang; Adam Wax; Ramachandra R. Dasari; Michael S. Feld
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Paper Abstract

We describe our phase-sensitive interferometry technique implemented as phase dispersion microscopy (PDM)/optical tomography (PDOT). The technique is based on measuring the phase difference between fundamental and second harmonic low coherence light in a novel interferometer. We attain high sensitivity to subtle refractive index differences due to dispersion with a differential optical path sensitivity of 5 nm. Using PDM, we show that ballistic light in a turbid medium undergoes a phase velocity change that is dependent on scatterer size. We demonstrate that the microscopy technique performs better than a conventional phase contrast microscope in imaging dispersive and weakly scattering samples. The tomographic implementation of the technique (PDOT) can complement Optical Coherence Tomography (OCT) by providing phase information about the scanned object.

Paper Details

Date Published: 23 May 2001
PDF: 8 pages
Proc. SPIE 4251, Coherence Domain Optical Methods in Biomedical Science and Clinical Applications V, (23 May 2001); doi: 10.1117/12.427872
Show Author Affiliations
Changhuei Yang, Massachusetts Institute of Technology (United States)
Adam Wax, Massachusetts Institute of Technology (United States)
Ramachandra R. Dasari, Massachusetts Institute of Technology (United States)
Michael S. Feld, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 4251:
Coherence Domain Optical Methods in Biomedical Science and Clinical Applications V
Valery V. Tuchin; Joseph A. Izatt; James G. Fujimoto, Editor(s)

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