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Proceedings Paper

Study of the mechanism of the light-scattering-mode superresolution near-field structure
Author(s): Wei Chih Lin; Jun Dar Su; Ming Chun Tsai; Din Ping Tsai; Nien Hua Lu; Hung Ji Huang; Wei Yi Lin
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Paper Abstract

The near-field recording mechanism of the super resolution near-field structure, glass/ZnS-SiO2/AgOx/ZnS-SiO2, has been studied experimentally. Near-field optical effects of the glass/ZnS-SiO2/AgOx/ZnS-SiO2 have been observed by a tapping mode tuning-fork near-field scanning optical microscope (TMTF-NSOM) on the transmitting light spot. Laser-excited surface plasmon at the interfaces of AgOx/ZnS-SiO2 thin film was detected by this technique. Results showed that the transmitting focused light through the AgOx type super resolution near-field structure consists of a propagating term and an evanescent one resulted from the localized surface plasmon of the AgOx thin film. A strong enhancement of the near-field intensity and the dynamic localized enhancement of the transmitting focused light were observed as well.

Paper Details

Date Published: 8 May 2001
PDF: 5 pages
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), (8 May 2001); doi: 10.1117/12.427055
Show Author Affiliations
Wei Chih Lin, National Taiwan Univ. (Taiwan)
Jun Dar Su, National Taiwan Univ. (Taiwan)
Ming Chun Tsai, National Taiwan Univ. (Taiwan)
Din Ping Tsai, National Taiwan Univ. (Taiwan)
Nien Hua Lu, Sze-hai Institute of Technology and Commerce (Taiwan)
Hung Ji Huang, National Chung-Cheng Univ. (Taiwan)
Wei Yi Lin, National Chung-Cheng Univ. (Taiwan)


Published in SPIE Proceedings Vol. 4416:
Optical Engineering for Sensing and Nanotechnology (ICOSN 2001)
Koichi Iwata, Editor(s)

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