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Proceedings Paper

Multipoint process monitoring system based on an acousto-optic tunable filter (AOTF)
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Paper Abstract

This paper describes a newly designed multipoint process monitoring system based on an acousto-optic tunable filter. In order to prove the feasibility of the suggested multipoint monitoring system for use in the NIR spectral region, some experiments were carried out in the visible range. The multipoint process monitoring system consists of an AOTF device for wavelength selecting, a CCD imaging sensor, and a specially designed in-line type of optical fiber probe. Unlike an FTS (Fourier Transform Spectrometry) based monitoring system, an AOTF has no moving parts, and it can be rapidly tuned to any wavelength in its operating range within microseconds. Thus, the AOTF is advantageous in terms of faster spectral imaging capability and rigidity required for industrial monitoring environment. Also, Fourier Transform Spectrometry experiments were conducted for comparison with the AOTF based monitoring system. In the current feasibility evaluation, an enhanced optical fiber probe with 3 monitoring points was used. However, the number of monitoring points can be easily expanded to dozens more points as required.

Paper Details

Date Published: 8 May 2001
PDF: 5 pages
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), (8 May 2001); doi: 10.1117/12.427049
Show Author Affiliations
Dae Suk Kim, Korea Advanced Institute of Science and Technology (South Korea)
Jang Woo You, Korea Advanced Institute of Science and Technology (South Korea)
Soo Hyun Kim, Korea Advanced Institute of Science and Technology (South Korea)
Hong-Jin Kong, Korea Advanced Institute of Science and Technology (South Korea)
Yun Woo Lee, Korea Research Institute of Standards and Science (South Korea)
Won Chegal, Korea Advanced Institute of Science and Technology (South Korea)
Yoon Keun Kwak, Korea Advanced Institute of Science and Technology (South Korea)


Published in SPIE Proceedings Vol. 4416:
Optical Engineering for Sensing and Nanotechnology (ICOSN 2001)
Koichi Iwata, Editor(s)

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