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Proceedings Paper

Low-coherence tandem interferometer for in-situ measurement of the refractive index
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Paper Abstract

The low-coherence interferometric technique is proposed for the in-situ measurement of the refractive index of dispersive samples with high accuracy. A tandem configuration of a Michelson interferometer and a triangular interferometer is used to compensate for the chirping effect which results from the broad spectrum of the light source. Thick samples can be successfully measured with the low- coherence interferometer, therefore the relative accuracy of the refractive index can be improved.

Paper Details

Date Published: 8 May 2001
PDF: 4 pages
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), (8 May 2001); doi: 10.1117/12.427034
Show Author Affiliations
Akiko Hirai, National Institute of Advanced Industrial Science and Technology (Japan)
Hirokazu Matsumoto, National Institute of Advanced Industrial Science and Technology (Japan)


Published in SPIE Proceedings Vol. 4416:
Optical Engineering for Sensing and Nanotechnology (ICOSN 2001)
Koichi Iwata, Editor(s)

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