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Proceedings Paper

Fourier plane filters and common path interferometry in vibrometers and electronic speckle interferometers
Author(s): Steven Richard Kitchen; Steen Gruner Hanson; Rene Skov Hansen
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Paper Abstract

In the present paper it will be shown how the introduction of a Fourier plane filter can create various types of common path interferometers for measuring changes in surface tilt or curvature of an object surface. This is obtained by placing a holographic optical element in the Fourier plane of a 4-f optical system. The interferometers are analyzed by using the paraxial approximation of the Huygens-Fresnel integral formalism, and the interferometer functions are given by a novel formalism using impulse response functions. Based on this technique, an interferometer for measuring dedicated changes in surface deflection is presented. This interferometer is insensitive to rigid surface rotations and displacements. The interferometer can be embedded in systems based on single point measurement of a time dependent deflection, i.e. vibrometers, as well as in full-field measurements such as electronic speckle interferometers.

Paper Details

Date Published: 8 May 2001
PDF: 4 pages
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), (8 May 2001); doi: 10.1117/12.427025
Show Author Affiliations
Steven Richard Kitchen, Risoe National Lab. (Denmark)
Steen Gruner Hanson, Risoe National Lab. (Denmark)
Rene Skov Hansen, Risoe National Lab. (Denmark)


Published in SPIE Proceedings Vol. 4416:
Optical Engineering for Sensing and Nanotechnology (ICOSN 2001)
Koichi Iwata, Editor(s)

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