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Proceedings Paper

Nondestructive evaluation of surface-subsurface-combined defects using photoacoustic microscope
Author(s): Haruo Endoh; Naoto Yaegashi; Yoichiro Hiwatashi; Tsutomu Hoshimiya
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Paper Abstract

The imaging of the simulated surface-subsurface combined defect using photoacoustic microscope has been demonstrated. Simulated surface and subsurface defects are fabricated independently such that the former was drilled on a pure aluminum plate whereas the latter was machined with end mill. Specimen with subsurface defect alone was also carried out. The photoacoustic image obtained clearly showed the location and the size of both subsurface defect and the surface-subsurface combined defect. The photoacoustic method is useful for detection of the combined defect which is difficult to detect with present NDE techniques.

Paper Details

Date Published: 8 May 2001
PDF: 4 pages
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), (8 May 2001); doi: 10.1117/12.426995
Show Author Affiliations
Haruo Endoh, Tohoku Gakuin Univ. (Japan)
Naoto Yaegashi, Tohoku Gakuin Univ. (Japan)
Yoichiro Hiwatashi, Tohoku Gakuin Univ. (Japan)
Tsutomu Hoshimiya, Tohoku Gakuin Univ. (Japan)


Published in SPIE Proceedings Vol. 4416:
Optical Engineering for Sensing and Nanotechnology (ICOSN 2001)
Koichi Iwata, Editor(s)

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