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Proceedings Paper

High-sensitivity high-dynamic digital CMOS imager
Author(s): Martin Waeny; Steve Tanner; Stefan C. Lauxtermann; Nicolas Blanc; M. Willemin; Martin Rechsteiner; Elko Doering; Joachim Grupp; Peter Seitz; Fausto Pellandini; Michael Ansorge
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Paper Abstract

CMOS image sensors offer over the standard and ubiquitous charge-coupled devices several advantages, in terms of power consumption, miniaturization, on-chip integration of analog- to-digital converters and signal processing for dedicated functionality. Due to the typically higher readout noise of CMOS cameras compared to CCD cameras applications demanding ultimate sensitivity were so far not accessible to CMOS cameras. This paper present an analysis of major noise sources, concepts to reduce them, and results obtained ona single chip digital camera with a QCIF resolution of 144 by 176 pixels and a dynamic range in excess of 120 dB.

Paper Details

Date Published: 15 May 2001
PDF: 7 pages
Proc. SPIE 4306, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications II, (15 May 2001); doi: 10.1117/12.426992
Show Author Affiliations
Martin Waeny, Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)
Steve Tanner, Univ. de Neuchatel (Switzerland)
Stefan C. Lauxtermann, Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)
Nicolas Blanc, Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)
M. Willemin, Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)
Martin Rechsteiner, Siemens Building Technologies (Switzerland)
Elko Doering, EM Microelectronic-Marin SA (Switzerland)
Joachim Grupp, Asulab SA (Switzerland)
Peter Seitz, Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)
Fausto Pellandini, Univ. de Neuchatel (Switzerland)
Michael Ansorge, Univ. de Neuchatel (Switzerland)


Published in SPIE Proceedings Vol. 4306:
Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications II
Nitin Sampat; Morley M. Blouke; John Canosa; John Canosa; Nitin Sampat, Editor(s)

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