Share Email Print

Proceedings Paper

IR-photorecorder KIT-2F: modification and certification tests
Author(s): Valeri P. Lazarchuk; Dmitri N. Litvin; Vladimir V. Mis'ko; Vasili M. Murugov; Sergei I. Petrov; Alexei V. Senik; Yuri N. Sheremetev; Edward V. Roos
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Results from investigation of the characteristics of a high- speed IR-photorecorder based on the ionization-type IR- camera KIT-2F and CCD-camera are presented. The photorecorder operate in the spectral range 1-10 micrometers with the frame exposure length of 1-100microsecond(s) , IR radiation detection threshold of 10-6 J/cm2 and spatial resolution of > 104 elem./frame. The photorecorder may be used for recording the structure of thermal fields in fast processes: in gas dynamics, ballistics, motor and aircraft building, pulsed welding and thermal treatment of surfaces, in powerful pulsed electric facilities et al. and for control of the IR laser radiation spatial characteristics.

Paper Details

Date Published: 15 May 2001
PDF: 7 pages
Proc. SPIE 4306, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications II, (15 May 2001); doi: 10.1117/12.426986
Show Author Affiliations
Valeri P. Lazarchuk, Russian Federal Nuclear Ctr. (Russia)
Dmitri N. Litvin, Russian Federal Nuclear Ctr. (Russia)
Vladimir V. Mis'ko, Russian Federal Nuclear Ctr. (Russia)
Vasili M. Murugov, Russian Federal Nuclear Ctr. (Russia)
Sergei I. Petrov, Russian Federal Nuclear Ctr. (Russia)
Alexei V. Senik, Russian Federal Nuclear Ctr. (Russia)
Yuri N. Sheremetev, Russian Federal Nuclear Ctr. (Russia)
Edward V. Roos, Lawrence Livermore National Lab. (United States)

Published in SPIE Proceedings Vol. 4306:
Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications II
Nitin Sampat; Morley M. Blouke; John Canosa; John Canosa; Nitin Sampat, Editor(s)

© SPIE. Terms of Use
Back to Top