Share Email Print
cover

Proceedings Paper

Development and characterization of an integrated multispectral polarimetric sensor: a discrete approach
Author(s): Dong-Hyun C. Kim; Cardinal Warde; Kenneth Vaccaro; Charles L. Woods; Alvin J. Drehman
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We introduce a new type of integrated imaging sensor that detects multispectral and polarimetric signatures in an IR scene. The sensor is a stack consisting of an IR detector array, and an array of multispectral and polarimetric filters. In this first phase of the research, we fabricated multispectral filters for the 3-5 micron waveband don sapphire substrates and polarimetric filters on silicon substrates. These were characterized separately and in mechanical contact as a single unit. The transmission characteristics of both filters show excellent agreement with the theoretical result. Whenthe filters are integrated into an imaging sensor, such a sensor is anticipated to improve image contrast with sensor-fusion post processing. In addition, it will offer portability and robustness because of its integrated nature.

Paper Details

Date Published: 15 May 2001
PDF: 10 pages
Proc. SPIE 4306, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications II, (15 May 2001); doi: 10.1117/12.426963
Show Author Affiliations
Dong-Hyun C. Kim, Massachusetts Institute of Technology (United States)
Cardinal Warde, Massachusetts Institute of Technology (United States)
Kenneth Vaccaro, Air Force Research Lab. (United States)
Charles L. Woods, Air Force Research Lab. (United States)
Alvin J. Drehman, Air Force Research Lab. (United States)


Published in SPIE Proceedings Vol. 4306:
Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications II
Nitin Sampat; Morley M. Blouke; John Canosa; John Canosa; Nitin Sampat, Editor(s)

© SPIE. Terms of Use
Back to Top