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Proceedings Paper

Silicon retina for real-time pattern recognition
Author(s): Lew F.C. Lew Yan Voon; Guy Cathebras; Benaissa Bellach; Bernard Lamalle; Patrick Gorria
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Paper Abstract

We present in this paper a programmable silicon retina designed for real-time pattern recognition. Its working principle is based on the comparison between an image projected on the retina by some opt9ical means and a reference binary image or mask memorized in the circuit. The result of the comparison is two signals corresponding to the sum of the currents produced by the pixels pertaining to the black and white zones of the reference binary image, this image when projected on the retina will produce a maximum white pixel current and a minimum black pixel current if it coincides perfectly with the reference binary image. If the projected image is shifted with respect to the reference binary image or if it is different then the black and white pixel currents will be different also. By measuring these two currents and by comparing them to expected values, a shift of the pattern or a difference between the observed and programmed pattern can be detected. Extensive computer simulations have been done in order to validate the working principle of the retina. Moreover, in order to verify the feasibility of the circuit in CMOS technology, we have fabricated a prototype non-programmable circuit in 1.2 micrometers standard CMOS technology. The measurements done on this circuit are quite encouraging and have been found to correspond to our expectations. Finally, the architecture of the programmable silicon retina, designed in a more recent 0.6 micrometers CMOS technology, is presented. This circuit is currently being fabricated.

Paper Details

Date Published: 15 May 2001
PDF: 10 pages
Proc. SPIE 4306, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications II, (15 May 2001); doi: 10.1117/12.426951
Show Author Affiliations
Lew F.C. Lew Yan Voon, Univ. de Bourgogne (France)
Guy Cathebras, Univ. Montpellier II (France)
Benaissa Bellach, Univ. de Bourgogne (France)
Bernard Lamalle, Univ. de Bourgogne (France)
Patrick Gorria, Univ. de Bourgogne (France)


Published in SPIE Proceedings Vol. 4306:
Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications II
Nitin Sampat; Morley M. Blouke; John Canosa; John Canosa; Nitin Sampat, Editor(s)

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