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Proceedings Paper

Ultrahigh-speed CMOS scanning linear imager family
Author(s): Robert M. Iodice; Jeffrey J. Zarnowski; Matthew A. Pace; Michael Joyner; Thomas L. Vogelsong; Terry L. Zarnowski
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Paper Abstract

A family of monochrome, high-speed linear imagers has been developed with each device to be available as a single chip fabricated using a standard commercially available CMOS process. Currently, the 2048 pixel device has been fabricated using a 0.5-micron CMOS process and its architecture, functionality and performance is described. The family of imagers features a unique combination of high functional integration, very high speed, low dark current, high sensitivity and high pixel-to-pixel uniformity. The pixels are 7.0 microns by 7.0 microns and have 100 percent fill factor. The high pixel-pixel uniformity is made possible by using low dark current pixels, a correlated double sampler circuit per pixel and a fully differential video bus. High functional integration is enabled by on-chip logic that is provided to minimize support circuitry and simplify application. Included are several exposure modes that provide full-frame electronic shutter, independent control of integration time and simultaneous integration and read-out. Only 5 volts DC and clock signal running at twice the desired pixel rate are required for basic operation. Low dark current and high sensitivity result from a novel pixel and low-noise preamplifier structure. A novel video multiplexing structure provides the very high read-out speed of 60 Mpixel/sec per 2048 pixel segment while sustaining an MTF of 50 percent at 35 line pairs per millimeter.

Paper Details

Date Published: 15 May 2001
PDF: 11 pages
Proc. SPIE 4306, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications II, (15 May 2001); doi: 10.1117/12.426946
Show Author Affiliations
Robert M. Iodice, Photon Vision Systems, Inc. (United States)
Jeffrey J. Zarnowski, Photon Vision Systems, Inc. (United States)
Matthew A. Pace, Photon Vision Systems, Inc. (United States)
Michael Joyner, Photon Vision Systems, Inc. (United States)
Thomas L. Vogelsong, Photon Vision Systems, Inc. (United States)
Terry L. Zarnowski, Photon Vision Systems, Inc. (United States)


Published in SPIE Proceedings Vol. 4306:
Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications II
Nitin Sampat; Morley M. Blouke; John Canosa; John Canosa; Nitin Sampat, Editor(s)

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