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Proceedings Paper

Polarization compensation in silicon-on-insulator arrayed waveguide grating devices
Author(s): Pavel Cheben; Andrew Bezinger; Andre Delage; Lynden Erickson; Siegfried Janz; Dan-Xia Xu
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Paper Abstract

As the AWG size is reduced our experimental and theoretical work demonstrates that it becomes increasingly difficult to suppress higher order modes and birefringence using ridge dimension alone. In part, it simply becomes difficult to meet the required fabrication tolerances when the ridge dimension approaches the order of a micron. We show that a novel polarization compensator scheme similar to that previously reported for a grating based demultiplexer in InP and consisting of simple shallow etched regions in the combiner sections of an SOI AWG, can eliminate the polarization sensitivity of the device by reducing the initial polarization dispersion of 2.22 nm to 0.04 nm. By combining the polarization compensator with mode filtering using appropriate array waveguide curvature, the shape of the array waveguides is no longer constrained. This allows the size of an AWG device to be scaled down to very small dimensions (e.g. less than a millimeter) and also permits the use of simple fabrication techniques such as wet etching. Our results were obtained on AWG devices based on 1.5 micrometers thick Si-on-insulator waveguides with a typical waveguide array area of a few square millimeters.

Paper Details

Date Published: 18 May 2001
PDF: 8 pages
Proc. SPIE 4293, Silicon-based and Hybrid Optoelectronics III, (18 May 2001); doi: 10.1117/12.426939
Show Author Affiliations
Pavel Cheben, National Research Council Canada (Canada)
Andrew Bezinger, National Research Council Canada (Canada)
Andre Delage, National Research Council Canada (Canada)
Lynden Erickson, National Research Council Canada (Canada)
Siegfried Janz, National Research Council Canada (Canada)
Dan-Xia Xu, National Research Council Canada (Canada)


Published in SPIE Proceedings Vol. 4293:
Silicon-based and Hybrid Optoelectronics III
David J. Robbins; John Alfred Trezza; Ghassan E. Jabbour, Editor(s)

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