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Proceedings Paper

Characterization of the near-surface region in ion-exchanged glass waveguides
Author(s): Flavio Horowitz; Marcelo Barbalho Pereira; M. Behar; Luiz Carlos Barbosa; Stefano Pelli; Giancarlo C. Righini
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Paper Abstract

In the characterization of graded-index glass waveguides, use of the standard m-line method by several laboratories has produced increasing discrepancies in the refractive index profile with decreasing film depth. We have addressed this very critical problem by a direct near-surface (DNS) approach, where the polarimetric Abeles-Hacskaylo method was extended as an admittance-matching condition for inhomogeneous films. In this paper, we review the measurement procedures of the same Ag+-exchanged waveguides by the DNS approach and by the m-line method, whose result showed significant disagreement at the film-air interface. We search the underlying reasons for this disagreement and test them against non-optical measurements of the ion-concentration profile, to reach a better understanding of the near-surface region, as well as of the distinct probing range of the m-line and DNS techniques.

Paper Details

Date Published: 15 May 2001
PDF: 6 pages
Proc. SPIE 4277, Integrated Optics Devices V, (15 May 2001); doi: 10.1117/12.426786
Show Author Affiliations
Flavio Horowitz, Univ. Federal do Rio Grande do Sul (Brazil)
Marcelo Barbalho Pereira, Univ. Federal do Rio Grande do Sul (Brazil)
M. Behar, Univ. Federal do Rio Grande do Sul (Brazil)
Luiz Carlos Barbosa, Univ. Estadual de Campinas (Brazil)
Stefano Pelli, Istituto di Ricerca sulle Onde Elettromagnetiche (Italy)
Giancarlo C. Righini, Istituto di Ricerca sulle Onde Elettromagniche (Italy)


Published in SPIE Proceedings Vol. 4277:
Integrated Optics Devices V
Giancarlo C. Righini; Seppo Honkanen, Editor(s)

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