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Proceedings Paper

Warm dense plasma characterization by x-ray Thomson scattering
Author(s): Otto L. Landen; S. H. Glenzer; Robert C. Cauble; Richard W. Lee; M. J. Edwards; J. S. DeGroot
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Paper Abstract

We describe how the powerful technique of spectrally resolved Thomson scattering can be extended to the x-ray regime, for direct measurements of the ionization state, density, temperature, and the microscopic behavior of dense cool plasmas. Such a direct measurement of microscopic parameters of solid density plasmas could eventually be used to properly interpret laboratory measurements of material properties such as thermal and electrical conductivity, EOS and opacity. In addition, x-ray Thomson scattering will provide new information on the characteristics of hitherto difficult to diagnose Fermi degenerate and strongly coupled plasmas.

Paper Details

Date Published: 23 April 2001
PDF: 8 pages
Proc. SPIE 4424, ECLIM 2000: 26th European Conference on Laser Interaction with Matter, (23 April 2001); doi: 10.1117/12.425572
Show Author Affiliations
Otto L. Landen, Lawrence Livermore National Lab. (United States)
S. H. Glenzer, Lawrence Livermore National Lab. (United States)
Robert C. Cauble, Lawrence Livermore National Lab. (United States)
Richard W. Lee, Lawrence Livermore National Lab. (United States)
M. J. Edwards, Lawrence Livermore National Lab. (United States)
J. S. DeGroot, Univ. of California/Davis (United States)


Published in SPIE Proceedings Vol. 4424:
ECLIM 2000: 26th European Conference on Laser Interaction with Matter
Milan Kalal; Karel Rohlena; Milan Sinor, Editor(s)

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