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Proceedings Paper

Determination of energy spectrum of laser-created heavy ions from their implantation depth profile in a metallic substrate
Author(s): Josef Krasa; Leos Laska; Karel Rohlena; Vratislav Perina; Vladimir Hnatowicz
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Paper Abstract

The energy spectrum of heavy ions emitted from laser- produced plasmas was determined by the use of a technique relying on the implantation of plasma ions into a substrate located close to the plasma. Ion energy spectra were reconstructed from depth profiles of the implanted ions measured by standard Rutherford back-scattering technique employing 2 MeV alpha particles scattered at 170 degrees laboratory angle. The energy spectra of Ag, Au, and Pb ions, implanted into aluminium or steel foils, are presented. A review of another techniques for ion energy spectrum measurement is presented and their limitations are compared.

Paper Details

Date Published: 23 April 2001
PDF: 4 pages
Proc. SPIE 4424, ECLIM 2000: 26th European Conference on Laser Interaction with Matter, (23 April 2001); doi: 10.1117/12.425553
Show Author Affiliations
Josef Krasa, Institute of Physics (Czech Republic)
Leos Laska, Institute of Physics (Czech Republic)
Karel Rohlena, Institute of Physics (Czech Republic)
Vratislav Perina, Nuclear Physics Institute (Czech Republic)
Vladimir Hnatowicz, Nuclear Physics Institute (Czech Republic)

Published in SPIE Proceedings Vol. 4424:
ECLIM 2000: 26th European Conference on Laser Interaction with Matter
Milan Kalal; Karel Rohlena; Milan Sinor, Editor(s)

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