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Proceedings Paper

Methods of determination of electric parameters of high-resistance layers with defects
Author(s): Edmundas Montrimas; Ringaudas Rinkunas; T. Lozovskis; Vygintas Jankauskas; R. Maldzius; S. Kuskevicius
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Paper Abstract

This work reviews three methods for determination of various parameters of a layer with defects. The first method involves placing the investigated layer between metal electrodes. However, results obtained by this method are now always reliable. The other two methods employ principles of electrophotography for investigation of layer properties. These methods allow to perform measurements without changing layer properties. Measurements are much faster and more precise than using the first method. The results are repeatable, it is sufficient to perform measurements on a single sample, which is not damaged during the measurements. The second method allows detection of single defects in a layer. This method is used in the case of layers with resistance higher than 1016 (Omega) per 1 cm2 of layer surface. The third method is used to measure properties of layers with resistance higher than 107 (Omega) per 1 cm2 of layer surface. The latter method allows easy determination of conditions when layer defects do not affect the measured parameters of the layers. This method is useful for investigation of layers with thickness ranging from a fraction of a micron to several hundreds of microns.

Paper Details

Date Published: 10 April 2001
PDF: 6 pages
Proc. SPIE 4415, Optical Organic and Inorganic Materials, (10 April 2001); doi: 10.1117/12.425499
Show Author Affiliations
Edmundas Montrimas, Vilnius Univ. (Lithuania)
Ringaudas Rinkunas, Vilnius Univ. (Lithuania)
T. Lozovskis, Vilnius Univ. (Lithuania)
Vygintas Jankauskas, Vilnius Univ. (Lithuania)
R. Maldzius, Vilnius Univ. (Lithuania)
S. Kuskevicius, Vilnius Univ. (Lithuania)

Published in SPIE Proceedings Vol. 4415:
Optical Organic and Inorganic Materials
Steponas P. Asmontas; Jonas Gradauskas, Editor(s)

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