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Proceedings Paper

Investigation of defect levels in semi-insulating materials by modulated photocurrent (MPC)
Author(s): J. Cwirko
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Paper Abstract

The modulated photo current measurements (MPC) are performed in frequency domain. The excess charge carriers are generated by light source, the intensity of which is sinusoidally modulated. The phase shift between excitation and photo current is dependent on the frequency and temperature. The parameters of defect levels are estimated from this shift.

Paper Details

Date Published: 17 April 2001
PDF: 4 pages
Proc. SPIE 4413, International Conference on Solid State Crystals 2000: Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, (17 April 2001); doi: 10.1117/12.425432
Show Author Affiliations
J. Cwirko, Military Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 4413:
International Conference on Solid State Crystals 2000: Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology
Jaroslaw Rutkowski; Jakub Wenus; Leszek Kubiak, Editor(s)

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