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Proceedings Paper

Photoluminescence Fourier-IR-transmission deep-level transient spectroscopy studies of diamond layers grown by hot-filament CVD
Author(s): Kazimierz Fabisiak; Agnieszka Banaszak; Zbigniew Lukasiak; Waclaw Bala; Marceli Kaczmarski
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Paper Abstract

The polycrystalline thin diamond films grown by HF CVD technique have been studied by FTIR, ESR, X-ray, Raman and photoluminescence spectroscopy. Pl spectra were recorded in temperatures range of 10-300K. The thermal behavior of the broad band luminescence indicates a D-A pair recombination process. The defects taking part in luminescence can be associated with hydrogen related centers. The presence of hydrogen in the diamond layers has been confirmed by FTIR and ESR measurements.

Paper Details

Date Published: 17 April 2001
PDF: 6 pages
Proc. SPIE 4413, International Conference on Solid State Crystals 2000: Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, (17 April 2001); doi: 10.1117/12.425428
Show Author Affiliations
Kazimierz Fabisiak, Institute of Physics (Poland)
Agnieszka Banaszak, Institute of Physics (Poland)
Zbigniew Lukasiak, N. Copernicus Univ. (Poland)
Waclaw Bala, N. Copernicus Univ. (Poland)
Marceli Kaczmarski, A. Mickiewicz Univ. (Poland)


Published in SPIE Proceedings Vol. 4413:
International Conference on Solid State Crystals 2000: Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology
Jaroslaw Rutkowski; Jakub Wenus; Leszek Kubiak, Editor(s)

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