Share Email Print

Proceedings Paper

Use of a rapid-scanning backscatter LIDAR to validate dispersion models
Author(s): Michael Bennett
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We review the history and capabilities of UMIST's Rapid- scanning Lidar (RASCAL). This is a backscatter Lidar designed to study aerosol dispersion from industrial plant. The system is fully computer-controlled and is based around a frequency- doubled Nd-YAG laser having a pulse repetition rate of 30 Hz. The signal is measured with a 10-bit, 60 MHz digitizer. Overall, a plume cross-section can be obtained in < 2 s and repeated every approximately 4 s. Such scanning can continue for several hours. Range resolution is typically 5 m with sensitivity down two a few (mu) g m-3 of aerosol. Over 10 years we have developed software to analyze the returns to estimate plume height, spread and intermittency; wind speed at plume height; and mixing layer depth. The backscatter from combustion plant plumes appears to be well enough conserved to allow point measurements within the plume to be interpreted as concentration/flux ratios, (c/Q) for comparison with dispersion models. This technique has recently been successfully tested using a chemical tracer. A substantial dataset acquired with the system has been used to test the predictions of various regulatory models. We present recent comparisons of modelled and measured c/Q at a small power station: the ensemble values show impressive agreement.

Paper Details

Date Published: 9 April 2001
PDF: 9 pages
Proc. SPIE 4397, 11th International School on Quantum Electronics: Laser Physics and Applications, (9 April 2001); doi: 10.1117/12.425181
Show Author Affiliations
Michael Bennett, UMIST (United Kingdom)

Published in SPIE Proceedings Vol. 4397:
11th International School on Quantum Electronics: Laser Physics and Applications
Peter A. Atanasov; Stefka Cartaleva, Editor(s)

© SPIE. Terms of Use
Back to Top