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Proceedings Paper

Defect generation in fused silica under high-intensity laser interaction
Author(s): Andrejs Silins
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Paper Abstract

Interaction of high intensity laser radiation with fused silica mainly introduces strong temperature increase in the region where this radiation is absorbed. The local temperature rises up to 2500 K or higher. At these temperatures high concentrations of thermal intrinsic point defects are generated. Estimated concentrations of equilibrium oxygen excess defects at 2500 K reaches 7(DOT)1018cm-3 and the main part of these defects are non-bridging oxygen atoms. Before equilibrium large part of oxygen excess defects are oxygen molecules. Presence of oxygen molecules in concentration 3(DOT)1018cm-3 creates the local internal pressure 1,0 atm. at 2500 K. As the result the boiling and evaporation of the material from the region where high intensity laser radiation is absorbed occurs. Remaining material contains increased concentrations of oxygen deficit point defects, such as three- and two-fold coordinated silicon atoms, as well as oxygen excess point defects which are tightly bonded to the glass network, such as non- bridging oxygen atoms. Presence of these defects causes the strong increase of UV-wavelength laser radiation absorption. This stimulates additional laser interaction with fused silica. New features in defect generation appears when very short (femtosecond) laser pulses are used. In this case the laser pulse length is comparable with the period of main atomic vibrations in fused silica. Such conditions open new sub-threshold intrinsic defect generation mechanisms.

Paper Details

Date Published: 12 April 2001
PDF: 5 pages
Proc. SPIE 4347, Laser-Induced Damage in Optical Materials: 2000, (12 April 2001); doi: 10.1117/12.425073
Show Author Affiliations
Andrejs Silins, Latvian Academy of Sciences (Latvia)


Published in SPIE Proceedings Vol. 4347:
Laser-Induced Damage in Optical Materials: 2000
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; Keith L. Lewis; M. J. Soileau, Editor(s)

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