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Proceedings Paper

Achromatic damage investigations on mirrors for UV-free electron lasers
Author(s): Alexandre Gatto; Norbert Kaiser; Roland Thielsch; David Garzella; M. Hirsch; Daniele Nutarelli; G. de Ninno; Eric Renault; Marie-Emmanuelle Couprie; Philippe Torchio; Marco Alvisi; Gerard Albrand; Claude Amra; Marino Marsi; Mauro Trovo; R. Walker; M. Grewe; Jean Paul Roger; Albert Claude Boccara
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Paper Abstract

Storage Ring Free Electron Laser (FEL) are attractive, full of promise, tuneable and powerful laser sources for the UV range. High reflectivity dielectric mirrors should be produced in order to allow lasing at very short wavelength, with a long stability in a strongly harsh environment and to optimize the extracted FEL power required for most of the newest applications. The front mirror of the laser cavity receives all the synchrotron radiation (SR) emitted by the wiggler, which is responsible for the mirror degradation, combined with the contamination by the vacuum residuals. We are tackling the problem of tests and manufactures of reliable robust mirrors and explore themes such as resistance analysis of UV mirrors to FEL multiscale power, broadband (X-UV) mirror robustness. Under drastic SR conditions, multiscale wavelength damages could be observed. Specific measurement techniques, able to investigate localized spatial modification induced by the non-uniform synchrotron radiation are presented. A local crystalline structure modification of the high index material appears together with a severe increase of the roughness.

Paper Details

Date Published: 12 April 2001
PDF: 12 pages
Proc. SPIE 4347, Laser-Induced Damage in Optical Materials: 2000, (12 April 2001); doi: 10.1117/12.425044
Show Author Affiliations
Alexandre Gatto, Fraunhofer-Institut fuer Angewandte Optik und Feinmechanik (Germany)
Norbert Kaiser, Fraunhofer-Institut fuer Angewandte Optik und Feinmechanik (Germany)
Roland Thielsch, Fraunhofer-Institut fuer Angewandte Optik und Feinmechanik (Germany)
David Garzella, CEA Saclay and Univ. de Paris-Sud (France)
M. Hirsch, CEA Saclay and Univ. de Paris-Sud (France)
Daniele Nutarelli, CEA Saclay and Univ. de Paris-Sud (France)
G. de Ninno, CEA Saclay and Univ. de Paris-Sud (France)
Eric Renault, CEA Saclay and Univ. de Paris-Sud (France)
Marie-Emmanuelle Couprie, CEA Saclay and Univ. de Paris-Sud (France)
Philippe Torchio, Ecole Nationale Superieure de Physique de Marseille (France)
Marco Alvisi, Ecole Nationale Superieure de Physique de Marseille (Italy)
Gerard Albrand, Ecole Nationale Superieure de Physique de Marseille (France)
Claude Amra, Ecole Nationale Superieure de Physique de Marseille (France)
Marino Marsi, Sincrotrone Trieste (Italy)
Mauro Trovo, Sincrotrone Trieste (Italy)
R. Walker, Sincrotrone Trieste (Italy)
M. Grewe, Univ. Dortmund (Germany)
Jean Paul Roger, Ecole Superieure de Physique et Chimie Industrielles (France)
Albert Claude Boccara, Ecole Superieure de Physique et Chimie Industrielles (France)


Published in SPIE Proceedings Vol. 4347:
Laser-Induced Damage in Optical Materials: 2000
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; Keith L. Lewis; M. J. Soileau, Editor(s)

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