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Proceedings Paper

Results of pulse-scaling experiments on rapid-growth DKDP triplers using the Optical Sciences Laser at 351 nm
Author(s): Michael J. Runkel; Alan K. Burnham; David Milam; Walter D. Sell; Michael D. Feit; Alexander M. Rubenchik
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Paper Abstract

Results are reported from recently performed bulk-damage, pulse-scaling experiments on DKDP tripler samples taken from NIF-size, rapid-growth boule BD7. The tests were performed on LLNL's Optical Sciences Laser. A matrix of samples was exposed to single shots at 351 nm (3(omega) ) with average fluences from 4 to 8 J/cm2 for pulse durations of 1, 3 and 10 ns. The damage sites were scatter-mapped after testing to determine the damage evolution as a function of local beam fluence. The average bulk damage microcavity (pinpoint) density varied nearly linearly with fluence with peak values of approximately 16,000 pp/mm3 at 1 ns, 10,000 pp/mm3 at 3 ns and 400 pp/mm3 at 10 ns for fluences in the 8-10 J/cm2 range. The average size of a pinpoint was 10(+14,-9) micrometers at 1 ns, 37+/- 20 micrometers at 3 ns and approximately 110 micrometers at 10 ns, although all pulse durations produced pinpoints with a wide distribution of sizes. Analysis of the pinpoint density data yielded pulse-scaling behavior of t0.35. Significant planar cracking around the pinpoint as was observed for the 10 ns case but not for the 1 and 3 ns pulses. Crack formation around pinpoints has also been observed frequently for Zeus ADT tests at approximately 8 ns. The high pinpoint densities also lead to significant eruption of near-surface bulk damage. Measurements of the damage site area for surface and bulk gave ratios (Asurf/Abulk) of 2:1 at 1 ns, 7:1 at 3 ns and 110:1 at 10 ns.

Paper Details

Date Published: 12 April 2001
PDF: 14 pages
Proc. SPIE 4347, Laser-Induced Damage in Optical Materials: 2000, (12 April 2001); doi: 10.1117/12.425024
Show Author Affiliations
Michael J. Runkel, Lawrence Livermore National Lab. (United States)
Alan K. Burnham, Lawrence Livermore National Lab. (United States)
David Milam, Lawrence Livermore National Lab. (United States)
Walter D. Sell, Lawrence Livermore National Lab. (United States)
Michael D. Feit, Lawrence Livermore National Lab. (United States)
Alexander M. Rubenchik, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 4347:
Laser-Induced Damage in Optical Materials: 2000
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; Keith L. Lewis; M. J. Soileau, Editor(s)

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