Share Email Print
cover

Proceedings Paper

Simulations of laser damage of SiO2 induced by a spherical inclusion
Author(s): Florian Bonneau; Patrick Combis; Jacques Vierne; G. Daval
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The purpose of this paper is to present the effect of a spherical inclusion in SiO2 under pulsed laser irradiation. The 3D electromagnetic field distribution (E, B) in the inclusion and the SiO2 bulk is calculated using the Mie theory extended to radially inhomogeneous media. The effects of electric field enhancement can be investigated for any size and any type (metallic or dielectric) of inclusion. This E-field enhancement may lead to direct breakdown of SiO2. The laser energy coupled with the inclusion and the host material is computed with the numerical code DELPOR along the laser duration. DELPOR is a 1D hydrodynamic code used for spherical geometry taking into account the laser solid- to-plasma interaction, thermal diffusion and phase transitions. During the laser pulse, the 1D hydrodynamic calculation is coupled with a 3D Lagrangian-Eulerian code to investigate the mechanical effects involved in the blow-up of the inclusion near the SiO2 slab surface. For a set of experimental conditions, we attempt to determine the role of mechanical effects and E-field enhancement. Our ultimate goal is to predict laser damage morphology as a function of the physical and geometrical parameters (inclusion type, size and depth) of the inclusion and to compare it with experimental data.

Paper Details

Date Published: 12 April 2001
PDF: 8 pages
Proc. SPIE 4347, Laser-Induced Damage in Optical Materials: 2000, (12 April 2001); doi: 10.1117/12.425023
Show Author Affiliations
Florian Bonneau, CEA Bruyeres-le-Chatel (France)
Patrick Combis, CEA Bruyeres-le-Chatel (France)
Jacques Vierne, CEA Bruyeres-le-Chatel (France)
G. Daval, CEA Bruyeres-le-Chatel (France)


Published in SPIE Proceedings Vol. 4347:
Laser-Induced Damage in Optical Materials: 2000
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; Keith L. Lewis; M. J. Soileau, Editor(s)

© SPIE. Terms of Use
Back to Top