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Proceedings Paper

Correlation between absorption and scattering imaging in optical materials (Abstract Only)
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Paper Abstract

Absorption and scattering present local defects which can be imaged simultaneously in exactly the same conditions, allowing a precise study of correlation between absorption and scattering spatial variations in thin film materials and surfaces. Absorption A is linearly related to the extinction coefficient whereas scattering S is mainly due to surface profile and refractive index variations. Furthermore spatial frequencies involved in these variations take a great part in scattering. However imaginary and real parts of the complex index are related by KK relations, and correlation A/S depending on the wavelength can be expected. Simulations in fused silica are presented. Studies of correlation give information about nature of defects.

Paper Details

Date Published: 12 April 2001
PDF: 3 pages
Proc. SPIE 4347, Laser-Induced Damage in Optical Materials: 2000, (12 April 2001); doi: 10.1117/12.425022
Show Author Affiliations
Mireille Commandre, Ecole Nationale Superieure de Physique de Marseille (France)
Alexandre Gatto, Ecole Nationale Superieure de Physique de Marseille (Germany)
Annelise During, Ecole Nationale Superieure de Physique de Marseille (France)
Caroline Fossati, Ecole Nationale Superieure de Physique de Marseille (France)


Published in SPIE Proceedings Vol. 4347:
Laser-Induced Damage in Optical Materials: 2000
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; Keith L. Lewis; M. J. Soileau, Editor(s)

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