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Proceedings Paper

Band-limited interpolation for maximum intensity projection images
Author(s): Sinae Kim; Samuel Moon-Ho Song; Nam-Ho Kim; Gunho Lee; Somchai Kreang-arekul; Akio Iwase; Robert Taylor
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Paper Abstract

X-ray computed tomography (CT) scanners, due to its inherent scanning geometry, provide images with non-isotropic voxels. The typical CT scanner generates axial slices with the thickness on the order of a few millimeters with sub- millimeter pixels. The multi-slice images obtained with such protocol must be then interpolated across the slices for an effective and realistic 3-D visualization of the patient anatomy. In this paper we focus on the effects of slice interpolation for maximum intensity projection (MIP) images with the projection direction orthogonal to the z-axis, for instance, for the generation of coronal or sagittal views. Linear interpolations, although simple, due to the inherent noise in the data, generate MIP images with noise whose variance vary quadratically along the z-axis. As such, the MIP images will often suffer from horizontal streaking artifacts, exactly at the position of the original slices. To combat this situation we have developed a different interpolation technique based on a digital finite impulse response (FIR) filter. It is shown that this band-limited interpolation based on the FIR filter will flatten the change in the noise variance along the z-axis, the net effect being either the elimination or a reduction of the horizontal streaking artifact.

Paper Details

Date Published: 11 April 2001
PDF: 8 pages
Proc. SPIE 4308, High-Speed Imaging and Sequence Analysis III, (11 April 2001); doi: 10.1117/12.424994
Show Author Affiliations
Sinae Kim, Korea Univ. (South Korea)
Samuel Moon-Ho Song, Korea Univ. (South Korea)
Nam-Ho Kim, Korea Univ. (South Korea)
Gunho Lee, Korea Univ. (South Korea)
Somchai Kreang-arekul, AccuImage Diagnostics Corp. (United States)
Akio Iwase, AccuImage Diagnostics Corp. (United States)
Robert Taylor, AccuImage Diagnostics Corp. (United States)

Published in SPIE Proceedings Vol. 4308:
High-Speed Imaging and Sequence Analysis III
James S. Walton; Alan M. Frank, Editor(s)

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