Share Email Print

Proceedings Paper

Surface characterization using confocal microscopy and wavelet transform analysis
Author(s): Mouade Bouydain; Jose F. Colom; Joan Anto; Josep Mallofre Pladellorens
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The traditional paper surface characterisation methods, for example based on air-stream leakage (Bendtsen, Parker print surf), are facing severe limitations. These traditional methods are better suited as indicators of erroneous production than for grading paper samples with respect to his print quality potential. It has been acknowledged that this research problem cannot be addressed without taking the papers three-dimensional structure into account. In this work, we will use a confocal image of the surface of the paper, obtained by imaging either a pinhole or a structured light pattern by a very high numerical aperture optical system on the surface of paper to be measured. In order to analyse the 3D image of the paper we perform a multiresolution analysis. This means that a given signal is decomposed at a coarse approximation plus added details. Applying the successive approximations recursively makes the approximation error go to zero. Using multiresolution analysis and orthonormal wavelet bases, we can construct an algorithm using wavelets. That will allow us to characterise the surface of the paper and grading paper samples with respect to his print quality potential.

Paper Details

Date Published: 13 April 2001
PDF: 8 pages
Proc. SPIE 4298, Three-Dimensional Image Capture and Applications IV, (13 April 2001); doi: 10.1117/12.424905
Show Author Affiliations
Mouade Bouydain, Univ. Politecnica de Catalunya (Spain)
Jose F. Colom, Univ. Politecnica de Catalunya (Spain)
Joan Anto, Univ. Politecnica de Catalunya (Spain)
Josep Mallofre Pladellorens, Univ. Politecnica de Catalunya (Spain)

Published in SPIE Proceedings Vol. 4298:
Three-Dimensional Image Capture and Applications IV
Brian D. Corner; Joseph H. Nurre; Roy P. Pargas, Editor(s)

© SPIE. Terms of Use
Back to Top