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Proceedings Paper

Light-measuring device diagnostics for the photometric and colorimetric measurement of flying-spot displays
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Paper Abstract

Flying-spot displays use narrow-spectrum high-power sources that scan the image across the display screen. They can provide a bright display with a large color gamut. When such displays are measure with conventional light-measuring devices (LMDs) such as luminance or illuminance meters, there is concern that the LMD may not accurately measure the display's photometric and colorimetric output. The unique characteristics of the source may exceed the limitations of the instrumentation. A series of diagnostics has been developed that allows for an evaluation of LMDs for use in measuring flying-spot displays. Limitations resulting from LMD saturation, timing, and tristimulus or photopic filters can be revealed, and in some cases, specific causes can be identified. Each diagnostic will be demonstrated using several instruments, including luminance meters, illuminance meters, colorimeters and spectro radiometers. Using a simple comparison box, flying-spot displays can be viewed side-by- side with steady-state sources in a bipartite image. After the sources have been visually matched in color and luminance, the two images can be measured with a particular LMD, and results compared. Any significant difference between results would indicate a limitation of the LMD. Further diagnostics, using integrating spheres, neutral density filters and interference filters, are used to aid in identifying the nature of the limitation, and in some cases, point to solutions.

Paper Details

Date Published: 30 April 2001
PDF: 13 pages
Proc. SPIE 4295, Flat Panel Display Technology and Display Metrology II, (30 April 2001); doi: 10.1117/12.424877
Show Author Affiliations
Paul A. Boynton, National Institute of Standards and Technology (United States)
Edward F. Kelley, National Institute of Standards and Technology (United States)

Published in SPIE Proceedings Vol. 4295:
Flat Panel Display Technology and Display Metrology II
Edward F. Kelley; Edward F. Kelley; Apostolos T. Voutsas, Editor(s)

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