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Proceedings Paper

Linewidth evaluation in VCSELs
Author(s): Pierluigi De Bernardis; Gian Paolo Bava; Laura Fratta
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Paper Abstract

We present a model to compute the linewidth in vertical-cavity surface-emitting lasers, accounting for the 3D-structure of real devices. To this aim we include the noise source in the field equations and treat both the noise and the structural characteristics by means of coupled mode theory. In this way we obtain an expression for the linewidth that is given as the standard relation, modified by two correction factors that account for spatial effects and modal dispersion of the resonator. In the numerical results we give some guidelines towards devices aimed to narrow-line emission and, as a significant example, we study the transition from gain to index-guided devices in oxide-confined VCSEL's.

Paper Details

Date Published: 4 May 2001
PDF: 12 pages
Proc. SPIE 4286, Vertical-Cavity Surface-Emitting Lasers V, (4 May 2001); doi: 10.1117/12.424810
Show Author Affiliations
Pierluigi De Bernardis, Istituto di Ricerca per l'Ingegneria delle Telecomunicazioni e dell'Informatica (Italy)
Gian Paolo Bava, Politecnico di Torino (Italy) and INFM (Italy) (Italy)
Laura Fratta, Politecnico di Torino (Italy) and INFM (Italy) (Italy)

Published in SPIE Proceedings Vol. 4286:
Vertical-Cavity Surface-Emitting Lasers V
Kent D. Choquette; Chun Lei, Editor(s)

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