Share Email Print

Proceedings Paper

Modal birefringences measurement of multilayer multimodal AlGaAS/AlAs waveguides
Author(s): Marco Secondini; Giuseppe Leo; Julien Nagle; Vincent Berger; Gaetano Assanto
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We describe a technique for the simultaneous measurement of all the modal birefringences in a (chi) (2) optical guide through surface emitting second harmonic generation (SESHG), which we applied to multilayer AlGaAs waveguides at 1319 nm, both before and after selective AlAs oxidation. By end-fire coupling linearly-polarized laser pulses into ridge waveguides, both forward- and back-propagating eigenpolarizations were excited due to Fresnel reflection at the output facet. Several TE-TM pairs of counterpropagating modes then interact through the quadratic nonlinearity, giving rise to interference of SESHG fields. With a single image acquisition of the SESHG far field by a CCD camera, we could evaluate the modal birefringences between all the excited TE- TM mode pairs at the fundamental frequency. This simple approach led us to estimate form-birefringence of our multilayer quadratic waveguides with the high accuracy required by optimized phase-matched interactions in parametric generators and oscillators. This technique is a valuable complement to standard m-line effective index evaluation, and a versatile one-shot tool for waveguide diagnostics.

Paper Details

Date Published: 1 May 2001
PDF: 5 pages
Proc. SPIE 4268, Growth, Fabrication, Devices, and Applications of Laser and Nonlinear Materials, (1 May 2001); doi: 10.1117/12.424634
Show Author Affiliations
Marco Secondini, Univ. degli Studi di Roma Tre (Italy)
Giuseppe Leo, Univ. degli Studi di Roma Tre (Italy)
Julien Nagle, Thomson-CSF (France)
Vincent Berger, Thomson-CSF (France)
Gaetano Assanto, Univ. degli Studi di Roma Tre (Italy)

Published in SPIE Proceedings Vol. 4268:
Growth, Fabrication, Devices, and Applications of Laser and Nonlinear Materials
Jeffrey W. Pierce; Kathleen I. Schaffers; Kathleen I. Schaffers, Editor(s)

© SPIE. Terms of Use
Back to Top