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Proceedings Paper

Materials surface topography and composition imaging using dynamic atomic force microscopy
Author(s): Valentinas J. Snitka; Vida Mizariene; Arturas Ulcinas
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Paper Abstract

A new technique has been developed to probe the surface microtopography an the viscoelastic properties with the nanometric resolution using the vibrating modes of Scanning Probe Microscopy. Weak cantilevers, although having good force sensitivity, have found limited use for investigating of material's nanomechanical properties by conventional force modulation and intermittent contact atomic force microscopy. This is due to low forces and indentations that these cantilevers are able to exert on the surface and high amplitudes needed to overcome adhesion to the surface. Here it is shown that by employing electrostatic forcing of cantilever the imaging of local elastic properties of surface and subsurface layers can be carried out. Also, by mechanically exciting the higher vibration modes in contact or intermittent contact with the surface and monitoring the phase of vibrations, the contrast due to local surface elasticity together with surface microtopography is obtained.

Paper Details

Date Published: 6 April 2001
PDF: 7 pages
Proc. SPIE 4234, Smart Materials, (6 April 2001); doi: 10.1117/12.424416
Show Author Affiliations
Valentinas J. Snitka, Kaunas Univ. of Technology (Lithuania)
Vida Mizariene, Kaunas Univ. of Technology (Lithuania)
Arturas Ulcinas, Kaunas Univ. of Technology (Lithuania)


Published in SPIE Proceedings Vol. 4234:
Smart Materials
Alan R. Wilson; Hiroshi Asanuma, Editor(s)

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