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Proceedings Paper

Impact shearing deformation behavior of interfacial crack in ENF test specimen
Author(s): Hideaki Ito; Tsutomu Ezumi; Susumu Takahashi; Kazuo Sato
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Paper Abstract

In this study, the dynamic fracture behavior of a bonded dissimilar material, which had the interfacial crack, was analyzed. The stress intensity factor of the interfacial crack was determined by using method of caustics and the simple type high-speed photography method for the analysis, and dynamic behavior of the interfacial crack, which received the shearing deformation, was observed. The test specimen shape was assumed to be ENF test specimen. The sample material made to epoxy resin and polycarbonate, and used an epoxy system adhesive for joining. As a result, the vibration characteristic was possessed in the interfacial crack as well as the crack in a homogeneous material. And, a dynamic fracture toughness of the interfacial crack reached a different value by a material and joined condition to receive the load. Moreover, the propagation behavior of the interfacial crack became a different result with receiving the load and the phase material. The interfacial crack wound to the upper phase material at the case when the upper phase material was a brittleness material, and the propagating angle of the crack was 70 degrees. The dynamic fracture behavior of the interfacial crack when the upper phase material was ductile material propagated on the interface at high speed. In addition, the time of the propagation of the crack became a result different depending on joined condition, too. When the upper phase material was brittle material, the crack propagation time became a slow result early for ductile materials. The dynamic fracture toughness value and the crack propagation time of the interfacial crack became different results by the difference of the component of the test specimen. Therefore, dynamic fracture toughness and the crack propagating behavior depended on a material and joined condition to receive the load.

Paper Details

Date Published: 17 April 2001
PDF: 6 pages
Proc. SPIE 4183, 24th International Congress on High-Speed Photography and Photonics, (17 April 2001); doi: 10.1117/12.424261
Show Author Affiliations
Hideaki Ito, Shibaura Institute of Technology (Japan)
Tsutomu Ezumi, Shibaura Institute of Technology (Japan)
Susumu Takahashi, Kanto Gakuin Univ. (Japan)
Kazuo Sato, Shibaura Institute of Technology (Japan)


Published in SPIE Proceedings Vol. 4183:
24th International Congress on High-Speed Photography and Photonics
Kazuyoshi Takayama; Tsutomo Saito; Harald Kleine; Eugene V. Timofeev, Editor(s)

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