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Proceedings Paper

Laser-based internal profile measurement system
Author(s): Ampere A. Tseng; Masahito Tanaka; Bharath Leeladharan
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Paper Details

Date Published:
Proc. SPIE SW104, Optical Design, ; doi: 10.1117/12.423139
Show Author Affiliations
Ampere A. Tseng, Arizona State Univ. (United States)
Masahito Tanaka, Arizona State Univ. (United States)
Bharath Leeladharan, Arizona State Univ. (United States)

Published in SPIE Proceedings Vol. SW104:
Optical Design
Kenneth E. Moore, Editor(s)

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