Share Email Print

Proceedings Paper

Advances in full-face full-complex SLM characterization
Author(s): Stanley E. Monroe Jr.; John Michael Rollins; Richard D. Juday
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

If an optical correlator is to perform at full potential, the filtersmith must know what complex action will result from the control he applies to the filter SLM. If the SLM is spatially variant (and all are, to some degree or other), the behavior may be different at every frequency plane pixel. We have previously reported characterization of the full-complex behavior at every pixel of the SLM. We have refined the method in two distinct ways: we are doing multi- step interferometry (rather than only phase quadrature), and we have significantly improved the isolation of an individual pixel's complex action.

Paper Details

Date Published: 20 March 2001
PDF: 10 pages
Proc. SPIE 4387, Optical Pattern Recognition XII, (20 March 2001); doi: 10.1117/12.421153
Show Author Affiliations
Stanley E. Monroe Jr., Lockheed Martin Missiles & Space (United States)
John Michael Rollins, Hernandez Engineering (United States)
Richard D. Juday, NASA Johnson Space Ctr. (United States)

Published in SPIE Proceedings Vol. 4387:
Optical Pattern Recognition XII
David P. Casasent; Tien-Hsin Chao, Editor(s)

© SPIE. Terms of Use
Back to Top