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Proceedings Paper

Synchronizing the IR camera to capture high-speed thermal transients
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Paper Abstract

Thermal transients caused by electrical switching devices and fast optical or electrical pulses only exist for a very short time (less than 1 millisecond). If the transient happens in a high thermal conductivity material, e.g. silicon wafer, the thermal transient will disappear in a few milliseconds or faster. Most modern IR cameras have external triggering capability. However, the IR camera often runs on its own clock. If the triggering of data acquisition is not synchronized with the camera, there is often an uncertainty of timing, e.g. 16.7 ms for camera running at 60Hz. Even when the IR camera is running at 500 Hz, there is 2 ms uncertainty. Depending on when you push/click the button, the high-speed thermal transients can be missed and they will disappear in the next image. We developed a technique to synchronize the IR camera to capture the thermal transients. By using a delay function, we can control the data acquisition very precisely to study the thermal transients.

Paper Details

Date Published: 23 March 2001
PDF: 7 pages
Proc. SPIE 4360, Thermosense XXIII, (23 March 2001); doi: 10.1117/12.421024
Show Author Affiliations
Hsin Wang, Oak Ridge National Lab. (United States)
Ralph B. Dinwiddie, Oak Ridge National Lab. (United States)


Published in SPIE Proceedings Vol. 4360:
Thermosense XXIII
Andres E. Rozlosnik; Ralph B. Dinwiddie, Editor(s)

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