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Proceedings Paper

Model-based algorithm for localization and measurement of miniature SMC objects
Author(s): JennKwei Tyan; Ming Fang
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Paper Abstract

This paper presents a model-based algorithm for localization and measurement of SMC objects in miniature scale. The algorithm comprises a coarse-to-fine search strategy that fully utilizes all available information from object region and contour. In the coarse search stage, the moment transformations combined with an iterative segmentation scheme enables object localization performed in large search space and produces rough estimates of the pose parameters. Then, the canny edge detection and interpolation process is applied to obtain accurate object boundary as best as possible that allows an iterative optimization procedure to refine the initial estimates. The essential idea underlying our approach is by modeling the object with a polygonal shape and assumes that the input object is located on simple image background, which is suitable for a pick-and-place system used by semiconductor assembly. Finally, the result shows a compromise between accuracy and image resolution.

Paper Details

Date Published: 4 April 2001
PDF: 9 pages
Proc. SPIE 4301, Machine Vision Applications in Industrial Inspection IX, (4 April 2001); doi: 10.1117/12.420904
Show Author Affiliations
JennKwei Tyan, Siemens Corporate Research, Inc. (United States)
Ming Fang, Siemens Corporate Research, Inc. (United States)


Published in SPIE Proceedings Vol. 4301:
Machine Vision Applications in Industrial Inspection IX
Martin A. Hunt, Editor(s)

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