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Proceedings Paper

Phase dependence of holographic sensitivity of photorefractive Cu:H:LiNbO3 waveguides
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Paper Abstract

The copper exchange effects in waveguides containing different HxLi1-xNbO3 phases are investigated. We have used x-ray diffraction, m-line spectroscopy in the visible, near UV and IR regions and holographic characterization methods. The crucial dependence of holographic sensitivity on phase composition has been found to be the specific feature of Cu:H:LiNbO3 waveguides. It is established, that the main peculiarities of optical and photorefractive properties are caused by simultaneous formation of Cu+ defects and (OH--Cu+) pair defects.

Paper Details

Date Published: 15 March 2001
PDF: 9 pages
Proc. SPIE 4358, Optics of Crystals, (15 March 2001); doi: 10.1117/12.418838
Show Author Affiliations
Sergey M. Kostritskii, Kemerovo State Univ. (Russia)
Yuri N. Korkishko, Moscow Institute of Electronics Technology (Russia)
Vyacheslav A. Fedorov, Moscow Institute of Electronics Technology (Russia)
Alexander N. Alkaev, Moscow Institute of Electronics Technology (Russia)


Published in SPIE Proceedings Vol. 4358:
Optics of Crystals
Vasiliy V. Shepelevich; N. N. Egorov, Editor(s)

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