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Proceedings Paper

Frequency noise analysis of semiconductor lasers
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Paper Abstract

For a fundamental etalon of optical frequency based on the external-cavity semiconductor laser (ECL), not only the long-term frequency stability but also the linewidth seems to be an important parameter. The linewidth broadening is dominated by fluctuations of the optical frequency. Parameters of these fluctuations and their spectral characteristics are crucial information for their suppression. We present an experimental setup for the frequency noise measurements designed for a free running 633 nm ECL with a stabilized reference He-Ne laser. We observed the corner frequency of the 1/f noise of the ECL of approximately 10 MHz. No significant spectral components over the 1/f noise corner frequency were found.

Paper Details

Date Published: 7 March 2001
PDF: 6 pages
Proc. SPIE 4356, 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, (7 March 2001); doi: 10.1117/12.417840
Show Author Affiliations
Petr Jedlicka, Institute of Scientific Instruments (Czech Republic)
Josef Lazar, Institute of Scientific Instruments (Czech Republic)


Published in SPIE Proceedings Vol. 4356:
12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics
Jan Perina; Miroslav Hrabovsky; Jaromir Krepelka, Editor(s)

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